Title: Towards Understanding Positive Bias Temperature Instability (PBTI) in Fully Recessed Gate GaN MIS-FETs
Authors: Wu, Tian-Li ×
Franco, Jacopo
Marcon, Denis
Bakeroot, Benoit
De Jaeger, Brice
Stoffels, Steve
Van Hove, Marleen
Groeseneken, Guido
Decoutere, Stefaan #
Issue Date: May-2016
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:63 issue:5 pages:1853-1859
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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