ITEM METADATA RECORD
Title: Deep reflectance maps
Authors: Rematas, Konstantinos
Ritschel, Tobias
Fritz, Mario
Gavves, Stratis
Tuytelaars, Tinne
Issue Date: 2016
Conference: IEEE conference on computer vision and pattern recognition - CVPR 2016 edition:29 location:Las Vegas, Nevada, USA date:26 June - 1 July 2016
Description: Rematas K., Ritschel T., Fritz M., Gavves E., Tuytelaars T., ''Deep reflectance maps'', 29th IEEE conference on computer vision and pattern recognition - CVPR 2016, June 26 - July 1, 2016, Las Vegas, Nevada, USA (accepted).
Publication status: accepted
KU Leuven publication type: IC
Appears in Collections:ESAT - PSI, Processing Speech and Images

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