Title: Investigation of the Fe/Si interface and its phase transformations
Authors: Fanciulli, M ×
Degroote, Stefan
Weyer, G
Langouche, Guido #
Issue Date: Apr-1997
Publisher: Elsevier science bv
Series Title: Surface science vol:377 issue:1-3 pages:529-533
Abstract: Thin Fe-57 films (3-10 Angstrom) have been grown by molecular beam epitaxy (MBE) on (7 x 7) reconstructed Si(111) and (2 x 1) reconstructed Si(001) surfaces and by e-gun evaporation on an H-terminated Si(lll) surface. Conversion electron Mossbauer spectroscopy (GEMS) with high statistical accuracy and resolution allowed a detailed microscopic investigation of the silicide formation mechanism and of the structural phase transformations upon annealing.
ISSN: 0039-6028
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
× corresponding author
# (joint) last author

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