Title: An X-ray diffraction study of interface roughness and diffusion in Ag/Pd superlattices
Authors: Temst, Kristiaan ×
Van Bael, Margriet
Van Haesendonck, Christian
Bruynseraede, Yvan
de Groot, DG
Koeman, N
Griessen, R #
Issue Date: Mar-1999
Publisher: Elsevier science sa
Series Title: Thin Solid Films vol:342 issue:1-2 pages:174-179
Abstract: The influence of thermal annealing on the surface and interface roughness of epitaxial Ag/Pd superlattices has been quantitatively characterized by high-angle X-ray diffraction and atomic force microscopy. Although Ag and Pd form a continuous series of solid solutions, it is shown that thermal annealing of the layered structure does not lead to complete interdiffusion, but rather to a clustering of the individual components. The bulk phase diagram of materials is clearly not the only factor determining the structural properties of thin layers in superlattices. (C) 1999 Elsevier Science S.A. All rights reserved.
ISSN: 0040-6090
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
Nuclear and Radiation Physics Section
× corresponding author
# (joint) last author

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