Title: A test-proven As-grown-Generation (A-G) model for predicting NBTI under use-bias
Authors: Ji, Z
Zhang, J.F
Lin, L
Duan, M
Zhang, W
Zhang, X
Gao, R
Kaczer, Ben
Franco, Jacopo
Schram, Tom
Horiguchi, Naoto
De Gendt, Stefan
Groeseneken, Guido
Issue Date: 2015
Host Document: VLSI Technology Symposium pages:T36-T37
Conference: VLSI Technology Symposium location:Kyoto Japan date:2015-06-15
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Molecular Design and Synthesis
ESAT - MICAS, Microelectronics and Sensors

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science