Root-cause failure analysis reveals harmful interaction between non-adjacent MoO3 and Al layers

MRS Fall Meeting Symposium P: Hybrid Oxide/Organic Interfaces in Organic Electronics, Date: 2014/01/01 - 2014/01/11, Location: Boston, MA USA

Publication date: 2014-01-01

MRS Fall Meeting Symposium P: Hybrid Oxide/Organic Interfaces in Organic Electronics

Root-cause failure analysis reveals harmful interaction between non-adjacent MoO3 and Al layers

Author:

Voroshazi, Eszter

Uytterhoeven, Griet ; Favia, Paola ; Bender, Hugo ; Conard, Thierry ; Cnops, Kjell ; Cheyns, David