Title: Defect-centric perspective of combined BTI and RTN time-dependent variability
Authors: Weckx, Pieter
Kaczer, Ben
Franco, Jacopo
Roussel, Philippe
Bury, Erik
Subirats, Alexandre
Groeseneken, Guido
Catthoor, Francky
Linten, Dimitri
Raghavan, Praveen
Thean, Aaron
Issue Date: 2015
Host Document: International Integrated Reliability Workshop - IIRW
Conference: International Integrated Reliability Workshop - IIRW location:Fallen Leaf Lake, CA US date:2015-10-11
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems

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