ITEM METADATA RECORD
Title: Impact of processing and back-gate biasing conditions on the low-frequency noise of ultra-thin buried oxide silicon-on-insulator nMOSFETs
Authors: Kudina, Valeriya
Garbar, Nicolai
Simoen, Eddy
Claeys, Cor
Issue Date: 2015
Publisher: Pergamon Press
Series Title: Solid-State Electronics vol:105 pages:37-44
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems

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