Title: Characterization of self-heating in high-mobility Ge FinFET pMOS devices
Authors: Bury, Erik
Kaczer, Ben
Mitard, Jerome
Collaert, Nadine
Khatami, N.S
Aksamija, Zlatan
Vasileska, Dragica
Raleva, Katerina
Witters, Liesbeth
Hellings, Geert
Linten, Dimitri
Groeseneken, Guido
Thean, Aaron
Issue Date: 2015
Host Document: IEEE Symposium on VLSI Technology pages:60-61
Conference: IEEE Symposium on VLSI Technology location:Kyoto Japan date:2015-06-15
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science