Grazing incidence nuclear resonant scattering of synchrotron radiation can be applied to perform depth-selective phase analysis and to determine the isotopic and magnetic structure of thin films and multilayers. Principles and recent experiments of this new kind of reflectometry are briefly reviewed. Methodological aspects are discussed. Model calculations demonstrate how the orientations of the sublattice magnetisation in ferro- and antiferromagnetic multilayers affect time-integral and time-differential spectra. Experimental examples show the efficiency of the method in investigating finite-stacking, in-plane and out-of-plane anisotropy and spin-flop effects in magnetic multilayers.