Title: Polytype determination at the SiC-SiO2 interface by internal electron photoemission scattering spectroscopy
Authors: Afanas'ev, Valeri
Stesmans, Andre #
Issue Date: Sep-2003
Publisher: Elsevier science sa
Series Title: Materials science and engineering b-solid state materials for advanced technology vol:102 issue:1-3 pages:308-312
Abstract: The characteristic energy loss corresponding to band-to-band electron excitation at the SiC surface is observed in the internal photoemission (IPE) spectra Of SiC-SiO2 interfaces for three polytypes of SiC (4H, 6H, and 15R). From this feature the SiC bandgap width at the interface with thermal oxide was found to be the same as in the bulk of SiC. This importantly indicates that oxidation in dry O-2 at temperatures as high as 1300 degreesC does not lead to polytypic transition in SiC. (C) 2003 Elsevier B.V. All rights reserved.
ISSN: 0921-5107
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Semiconductor Physics Section
# (joint) last author

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