Title: Ellipsometric depth profiling of the refractive index: a neural network method and its application to a surface-induced inhomogeneity in a liquid crystal
Authors: Glorieux, Christ ×
DeSchrijver, P
Thoen, Jan #
Issue Date: Oct-1997
Publisher: Institute of Physics and IOP Publishing
Series Title: Journal of physics. D, applied physics vol:30 issue:19 pages:2656-2662
Abstract: A neural network approach is used to reconstruct surface-induced refractive-index profiles from angular and wavelength spectra from ellipsometric signals, The performance of the method is assessed using a large set of simulated profiles in a wide, parametrized profile space. The neural network optical profile recognition technique is applied to data of ellipsometric measurements on a liquid-crystal sample in the isotropic phase, which is inhomogeneously aligned at the surface because of surface-induced pre-nematic ordering in the vicinity of the isotropic-nematic phase-transition temperature.
ISSN: 0022-3727
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Soft Matter and Biophysics
× corresponding author
# (joint) last author

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