Title: Epitaxial Ni-Al thin films on NaCl using a Ag buffer layer
Authors: Yandouzi, M
Toth, L
Vasudevan, V
Cannaerts, Maarten
Van Haesendonck, Christian
Schryvers, D #
Issue Date: Nov-2000
Publisher: Taylor & francis ltd
Series Title: Philosophical magazine letters vol:80 issue:11 pages:719-724
Abstract: Epitaxial nanoscale [001] films of NixAl100-x (x = 52.5) have been prepared by physical vapour deposition on to a thin him of Ag [001] on NaCl (001) faces with occasional hillocks. The Ag film contains numerous dislocations and stacking faults and has a rms surface roughness of 2 nm. The Ni-Al film is ordered in the B2 structure and reveals many dislocations as well as antiphase boundaries between ordered domains. The formation of subgrains in the Ni-Al film results in severe height variations up to 30 nm across the surface. A cross-sectional model for the growth of both films is presented.
ISSN: 0950-0839
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
# (joint) last author

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