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Title: Effect of capture and escape phenomena in Monte Carlo technique on the simulation of the nonlinear characteristics in high electron mobility transistors
Authors: Abou-Khalil, M
Schreurs, Dominique ×
Nauwelaers, Bart
Van Rossum, Marc
Maciejko, R
Wu, K #
Issue Date: Dec-1997
Publisher: American Institute of Physics
Series Title: Journal of Applied Physics vol:82 issue:12 pages:6312-6318
ISSN: 0021-8979
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Physics and Astronomy - miscellaneous
× corresponding author
# (joint) last author

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