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Title: Critical fields of W/Si multilayers
Authors: Rosseel, E ×
Baert, M
Temst, Kristiaan
Potter, C
Moshchalkov, Victor
Bruynseraede, Yvan
Lobotka, P
Vavra, I
Senderak, R
Jergel, M #
Issue Date: May-1994
Publisher: Elsevier science bv
Series Title: Physica C vol:225 issue:3-4 pages:262-268
Abstract: Amorphous W/Si multilayers, with single layer thicknesses varying between 10 and 100 angstrom, have been prepared by UHV electron beam evaporation. The superconducting samples (d(W) < 30 angstrom, 3 K < T(c) < 4.2 K) are characterized by a negative temperature coefficient of the resistivity. The non-superconducting samples (d(W) > 30 angstrom) have a positive coefficient. With decreasing temperature, the parallel critical field H(c2 parallel-to)(T) shows a dimensional crossover which depends on the ratio between the total multilayer thickness and the in-plane superconducting coherence length. The amorphous character of the layers enables one to prepare continuous and smooth W layers with thicknesses down to d(W)=10 angstrom. These ultrathin layers give rise to very high values of the parallel critical fields.
URI: 
ISSN: 0921-4534
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
Nuclear and Radiation Physics Section
× corresponding author
# (joint) last author

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