Author:

Keywords:

Microwave measurements, uncertainty analysis, Science & Technology, Technology, Engineering, Electrical & Electronic, Engineering, Microwave measurements uncertainty, microwave transistors, nonlinear de-embedding, vector-calibrated nonlinear measurements, HARMONIC LOAD-PULL, NETWORK-ANALYZER, ACCURACY, PHASE, 0906 Electrical and Electronic Engineering, 1005 Communications Technologies, Networking & Telecommunications, 5103 Classical physics

Abstract:

We evaluate the uncertainty in on-wafer vector-calibrated nonlinear measurements with the National Institute of Standards and Technology (NIST) Microwave Uncertainty Framework. We include in our analysis uncertainties in the passive calibration standards, power meter, NIST-traceable phase calibration reference, cable bending, and probe alignment. These uncertainties are propagated first to the electrical quantities across the terminals of the device-under-test, which was an on-wafer microwave transistor. Next, we propagate uncertainties to the transistor current-generator plane, whose temporal voltage/current waveforms and impedances are of interest for the design of power amplifiers.