Journal of Magnetism and Magnetic Materials vol:240 issue:1-3 pages:380-382
Fe films, 300 Angstrom thick, were deposited by molecular beam epitaxy on amorphous SiO2 substrates previously coated with an Ag buffer layer of varying thickness (0-50-100-150 Angstrom). The surface roughness of the Ag buffer layer grows with increasing thickness. Magnetization measurements revealed that both the magnetization reversal process and the coercivity are profoundly influenced by the surface roughness. (C) 2002 Elsevier Science B.V. All rights reserved.