Title: Structural characterization of metastable FeSi films and of Fe/FeSi multilayers
Authors: Moons, R ×
Degroote, Stefan
Dekoster, J
Vantomme, André
Langouche, Guido #
Issue Date: Mar-1998
Publisher: Elsevier science bv
Series Title: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms vol:136-138 pages:268-272
Abstract: The structural properties of molecular beam epitaxy (MBE)-grown metastable CsCl-type FeSi (i.e. an iron silicide with the CsCl lattice structure) on Si (1 1 1) and of Fe/FeSi multilayers grown with MBE on MgO (0 0 1) are reported. Rutherford backscattering and channeling spectrometry (RBS-C) combined with X-ray diffraction are used to determine the structure, epitaxy and crystalline quality of the layers. Single metastable CsCl-FeSi layers could be stabilized epitaxially up to a thickness of 62 nm and are found to be twinned with respect to the Si (1 1 1) substrate, Moreover, an extensive study on antiferromagnetically (AF) coupled (Fe/FeSi)(15)/MgO multilayers indicates that the Fe layers are slightly expansively strained while the FeSi spacers are fully relaxed. Further, we could grove that the FeSi spacers in the multilayers have a cubic CsCl lattice structure with a lattice parameter of 0.28 nm. (C) 1998 Elsevier Science B.V.
ISSN: 0168-583X
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
× corresponding author
# (joint) last author

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