Title: Temperature and angular effects on the channelled implantation of Er into Si < 111 >
Authors: Hogg, SM ×
Vantomme, André
Wu, MF
Pipeleers, Bert
Swart, M #
Issue Date: Apr-2001
Publisher: Elsevier science bv
Series Title: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms vol:175-177 pages:585-589
Abstract: High dose (similar to 1 x 10(17)/cm(2)) channelled implantation of Er into Si along the <1 1 1 > direction has been investigated. These doses are suitable for channelled ion beam synthesis (CIBS) of ErSi1.7 layers. A study of the influence of the implantation temperature between 470-800 degreesC and the effect of the angle up to +/-5 degrees from the <1 1 1 > direction has been carried out. Increasing the temperature results in significant improvements in the as-implanted material. The optimal temperature range is 600-700 degreesC. Higher temperatures result in diffusion of the implanted Er to the surface where it is sputtered away by the incoming ions. Comparison of the experimental angular dependence with simulations and theory shows good agreement. Implantations at <4 degrees from the channelling direction form a continuous silicide layer after annealing. (C) 2001 Elsevier Science B.V. All rights reserved.
ISSN: 0168-583X
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
× corresponding author
# (joint) last author

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