Title: Piezoresistive detection-based ferromagnetic resonance force microscopy of microfabricated exchange bias systems
Authors: Volodine, Alexandre ×
Buntinx, Dieter
Brems, Steven
Van Haesendonck, Christian #
Issue Date: Dec-2004
Publisher: Amer inst physics
Series Title: Applied Physics Letters vol:85 issue:24 pages:5935-5937
Abstract: Ferromagnetic resonance measurements were performed on CoO/Co exchange biased microstructures with a low-temperature magnetic resonance force microscope (MRFM). The MRFM instrument relies on piezoresistive force detection, and the magnetic tip attached to the cantilever acts as a field gradient source. These features extend the applicability of the MRFM that can also be used as a conventional magnetic force microscope. Spatial variations of the MRFM signal, which are induced by a spatially modulated exchange bias, are monitored with a lateral resolution of about 5 mum. (C) 2004 American Institute of Physics.
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
× corresponding author
# (joint) last author

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