Title: Neural network application to the inverse scattering problem in high-resolution X-ray diffraction
Authors: Glorieux, Christ
Zolotoyabko, E #
Issue Date: Jun-2001
Publisher: Munksgaard int publ ltd
Series Title: Journal of Applied Crystallography vol:34 Part 3 pages:336-342
Abstract: The complicated inverse scattering problem of reconstructing depth-dependent lattice parameters from high-resolution X-ray diffraction spectra is analysed by using neural networks. Attention is paid to the practically important case of structural modifications in the near-surface layers of ion-implanted single crystals. The feasibility of a neural network algorithm is assessed on the basis of the performance statistics on a large number of simulated examples. The performance of the method on experimental data is tested using high-resolution X-ray diffraction spectra taken from He-implanted lithium niobate crystals.
ISSN: 1600-5767
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Soft Matter and Biophysics
# (joint) last author

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