Title: Tunnel barrier properties of stressed ferromagnetic tunnel junctions
Authors: Das, Johan
Degraeve, R
Boeve, H
Duchamps, P
Lagae, Liesbet
Groeseneken, Guido
Borghs, Gustaaf
De Boeck, J #
Issue Date: Mar-2001
Publisher: Iee-inst elec eng
Series Title: Electronics Letters vol:37 issue:6 pages:356-358
Abstract: The oxide breakdown properties of ultra-thin (similar to1 nm), naturally oxidised Al2O3 tunnel barriers in magnetic tunnel junctions were studied using ramped and constant stress experiments. During stress measurements at 1.35V, a fast breakdown of the junction was observed. The time-to-breakdown is evaluated using Weibull statistics. as commonly utilised in SiO2 reliability studies.
ISSN: 0013-5194
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Physics and Astronomy - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
Solid State Physics and Magnetism Section
# (joint) last author

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