Title: On the effect of technology scaling on variation-resilient sub-threshold circuits
Authors: Reynders, Nele ×
Dehaene, Wim #
Issue Date: Jan-2015
Publisher: Pergamon Press
Series Title: Solid-State Electronics vol:103 pages:19-29
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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