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Title: Roughness in Nb/Cu multilayers determined by x-ray-diffraction and atomic-force microscopy
Authors: Temst, Kristiaan ×
Van Bael, Margriet
Wuyts, B
Van Haesendonck, Christian
Bruynseraede, Yvan
Degroot, DG
Koeman, N
Griessen, R #
Issue Date: Dec-1995
Publisher: Amer inst physics
Series Title: Applied Physics Letters vol:67 issue:23 pages:3429-3431
Abstract: Nb/Cu multilayers grown by molecular beam epitaxy have been studied by x-ray diffraction and atomic force microscopy. X-ray diffraction provides the average interface roughness while atomic force microscopy shows the roughness and topology of the upper surface. Comparison of both methods shows that high-angle diffraction averages over a lateral length which is in good agreement with the typical grain size. (C) 1995 American Institute of Physics.
URI: 
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
Nuclear and Radiation Physics Section
× corresponding author
# (joint) last author

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