|ITEM METADATA RECORD
|Title: ||Investigation of bulk and DTMOS triple-gate devices under 60 MeV proton irradiation|
|Authors: ||Andrade, Maria Gloria Cano|
|Issue Date: ||2014 |
|Series Title: ||Microelectronics Reliability vol:54 issue:11 pages:2349-2354|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Supporting Services Campusmanagement Science, Engineering and Technology|
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