Title: Investigation of bulk and DTMOS triple-gate devices under 60 MeV proton irradiation
Authors: Andrade, Maria Gloria Cano
Martino, Joao
Aoulaiche, Marc
Collaert, Nadine
Simoen, Eddy
Claeys, Cor
Issue Date: 2014
Publisher: Elsevier
Series Title: Microelectronics Reliability vol:54 issue:11 pages:2349-2354
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

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