Title: Local traps as nanoscale reaction-diffusion probes: B clustering in c-Si
Authors: Hantschel, Thomas
Pawlak, B.J
Cowern, N.E.B
Ahn, C
Vandervorst, Wilfried
Gwilliam, R
van Berkum, J.G.M
Issue Date: 2014
Publisher: American Institute of Physics
Series Title: Applied Physics Letters vol:105 issue:22 pages:221603
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

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