Title: Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors
Authors: Fleischmann, Claudia ×
Conard, Thierry
Havelund, Rasmus
Franquet, Alexis
Poleunis, Claude
Voroshazi, Eszter
Delcorte, Arnaud
Vandervorst, Wilfried #
Issue Date: 2014
Publisher: John Wiley & Sons
Series Title: Surface and Interface Analysis vol:46 issue:S1 pages:54-57
ISSN: 0142-2421
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
× corresponding author
# (joint) last author

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