Title: Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics
Authors: dos Santos, Sara ×
Cretu, Bogdan
Strobel, Vincent
Routoure, Jean-Marc
Carin, Regis
Martino, Joao Antonio
Aoulaiche, Marc
Simoen, Eddy
Claeys, Cor #
Issue Date: 2014
Publisher: Pergamon Press
Series Title: Solid-State Electronics vol:97 pages:14-22
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science