Title: Stability evaluation of Au-free ohmic contacts on AlGaN/GaN HEMTs under a constant current stress
Authors: Wu, Tian-Li
Marcon, Denis
Stoffels, Steve
You, Shuzhen
De Jaeger, Brice
Van Hove, Marleen
Groeseneken, Guido
Decoutere, Stefaan
Issue Date: 2014
Publisher: Elsevier
Series Title: Microelectronics Reliability vol:54 issue:9-10 pages:2232-2236
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

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