|ITEM METADATA RECORD
|Title: ||Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices|
|Authors: ||Celano, Umberto|
|Issue Date: ||2014 |
|Series Title: ||Microelectronic Engineering vol:120 pages:67-70|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Supporting Services Campusmanagement Science, Engineering and Technology|
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