Title: Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices
Authors: Celano, Umberto
Goux, Ludovic
Opsomer, Karl
Iapichino, Martina
Belmonte, Attilio
Franquet, Alexis
Hoflijk, Ilse
Detavernier, Christophe
Jurczak, Malgorzata
Vandervorst, Wilfried
Issue Date: 2014
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:120 pages:67-70
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

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