Reference-free , in-depth characterization of nanoscaled systems with advanced grazing incidence X-ray fluorescence analysis

European Conference on X-Ray Spectrometry - EXRS, Date: 2014/01/01 - 2014/01/06, Location: Bologna Italy

Publication date: 2014-01-01

Reference-free , in-depth characterization of nanoscaled systems with advanced grazing incidence X-ray fluorescence analysis

Author:

Hoenicke, Philipp

Mueller, Matthias ; Detlefs, Blanka ; Fleischmann, Claudia ; Beckhoff, Burkhard