Title: Characterization of semiconductor samples using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy
Authors: Hermann, Peter ×
Hoehl, Arne
Ulrich, Georg
Fleischmann, Claudia
Hermelink, Antje
Kästner, Bernd
Patoka, Piotr
Hornemann, Andrea
Beckhoff, Burkhard
Rühl, Eckart
Ulm, Gerhard #
Issue Date: 2014
Publisher: Optical Society of America
Series Title: Optics Express vol:22 issue:15 pages:17948-17958
ISSN: 1094-4087
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology
× corresponding author
# (joint) last author

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