Title: Analog performance of standard and uinaxial strained triple-gate SOI FinFET under X-ray radiation
Authors: Bordallo, Caio ×
Teixeira, Fernando
Silveira, Marcilei
Agopian, Paula G.D
Martino, Joao A
Simoen, Eddy
Claeys, Cor #
Issue Date: 2014
Publisher: IOP Pub.
Series Title: Semiconductor Science and Technology vol:29 issue:12
Article number: 125015
ISSN: 0268-1242
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology
× corresponding author
# (joint) last author

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