Title: Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs
Authors: Simoen, Eddy
Federico, Antonio
Aoulaiche, Marc
Ritzenthaler, Romain
Schram, Tom
Arimura, Hiroaki
Cho, Moon Ju
Kauerauf, Thomas
Groeseneken, Guido
Horiguchi, Naoto
Thean, Aaron
Crupi, Felice
Spessot, Alessio
Caillat, Chirstian
Fazan, Pierre
Na, Hoon Joo
Son, Yunik
Noh, Kyung Bong
Issue Date: 2014
Publisher: IOP Pub.
Series Title: Semiconductor Science and Technology vol:29 issue:11 pages:115015
ISSN: 0268-1242
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

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