Title: Border traps in InGaAs nMOSFETs assessed by low-frequency noise
Authors: Scarpino, Mercedes ×
Gupta, Somya
Lin, Dennis
Alian, AliReza
Crupi, Felice
Collaert, Nadine
Thean, Aaron
Simoen, Eddy #
Issue Date: 2014
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:35 issue:7 pages:720-722
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Sustainable Metals Processing and Recycling
× corresponding author
# (joint) last author

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