Title: Interplay between statistical variability and reliability in contemporary p-MOSFETs: measurements vs. simulated
Authors: Hussin, Razaidi ×
Amoroso, Salvatore
Gerrer, Louis
Kaczer, Ben
Weckx, Pieter
Franco, Jacopo
Vanderheyden, Annelies
Vanhaeren, Danielle
Horiguchi, Naoto
Asenov, Asen #
Issue Date: 2014
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:61 issue:9 pages:3265-3273
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology
× corresponding author
# (joint) last author

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