Title: Use of SSTA tools for evaluating BTI impact on combinational circuits
Authors: Camargo, V. V. A
Kaczer, Ben
Wirth, G
Grasser, T
Groeseneken, Guido
Issue Date: 2014
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Very Large Scale Integration (VLSI) Systems vol:22 issue:2 pages:280-285
ISSN: 1063-8210
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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