Title: Development of a technique for characterizing bias temperature unstability-induced device-to-device variation at SRAM-relevant conditions
Authors: Duan, M ×
Zhang, J. F
Ji, Z
Zhang, W. D
Kaczer, Ben
Schram, Tom
Ritzenthaler, Romain
Groeseneken, Guido
Asenov, A #
Issue Date: 2014
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:61 issue:9 pages:3081-3089
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology
× corresponding author
# (joint) last author

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