Title: Process induced degradation of SiO2 and a-Si:H passivation layers for photovoltaic applications
Authors: O'Sullivan, Barry ×
Bearda, Twan
Nadupalli, Shankari
Labie, Riet
Baert, Kris
Gordon, Ivan
Poortmans, Jef #
Issue Date: 2014
Publisher: IEEE
Series Title: EEE Journal of Photovoltaics vol:4 issue:5 pages:1197-1203
ISSN: 2156-3381
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - ELECTA, Electrical Energy Computer Architectures
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science