Title: Atomistic pseudo-transient BTI simulation with inherent workload memory
Authors: Rodopoulos, D
Weckx, Pieter
Noltsis, M
Catthoor, Francky
Soudris, D
Issue Date: 2014
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:14 issue:2 pages:704-714
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems

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