|ITEM METADATA RECORD
|Title: ||Atomistic pseudo-transient BTI simulation with inherent workload memory|
|Authors: ||Rodopoulos, D|
|Issue Date: ||2014 |
|Publisher: ||Institute of Electrical and Electronics Engineers|
|Series Title: ||IEEE Transactions on Device and Materials Reliability vol:14 issue:2 pages:704-714|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Supporting Services Campusmanagement Science, Engineering and Technology|
|Files in This Item:
There are no files associated with this item.
Request a copy
All items in Lirias are protected by copyright, with all rights reserved.
© Web of science