Title: Application of scanning spreading resistance microscopy (SSRM) for GaN-on-silicon power structures
Authors: Kandaswamy, Prem Kumar
Saripalli, Yoga
Van Hove, Marleen
You, Shuzhen
Zhao, Ming
Liang, Hu
Vanhaeren, Danielle
Vanderheyden, Annelies
Schulze, Andreas
Eyben, Pierre
Decoutere, Stefaan
Langer, Robert
Vandervorst, Wilfried
Issue Date: 2014
Conference: International Workshop on Nitride Semiconductors - IWN location:Wroclaw Poland date:2014-08-24
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:Nuclear and Radiation Physics Section

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