Title: Reference-free, depth dependent characterization of nanoscale materials by combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis
Authors: Hoenicke, Philipp
Mueller, Matthias
Detlefs, Blanka
Fleischmann, Claudia
Beckhoff, Burkhard
Issue Date: 2014
Conference: 79. Jahrestagung der DPG und DPG-Frühjahrstagung location:Berlin Germany date:2015-03-15
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:Nuclear and Radiation Physics Section

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