|ITEM METADATA RECORD
|Title: ||Reference-free, depth dependent characterization of nanoscale materials by combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis|
|Authors: ||Hoenicke, Philipp|
|Issue Date: ||2014 |
|Conference: ||79. Jahrestagung der DPG und DPG-Frühjahrstagung location:Berlin Germany date:2015-03-15|
|Publication status: ||published|
|KU Leuven publication type: ||IMa|
|Appears in Collections:||Supporting Services Campusmanagement Science, Engineering and Technology|
|Files in This Item:
There are no files associated with this item.
All items in Lirias are protected by copyright, with all rights reserved.