Reference-free, depth dependent characterization of nanoscale materials by combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis

79. Jahrestagung der DPG und DPG-Frühjahrstagung, Date: 2015/01/01 - 2015/01/03, Location: Berlin Germany

Publication date: 2014-01-01

Reference-free, depth dependent characterization of nanoscale materials by combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis

Author:

Hoenicke, Philipp

Mueller, Matthias ; Detlefs, Blanka ; Fleischmann, Claudia ; Beckhoff, Burkhard