Title: Understanding the impact of programming pulses and electrode materials on the endurance properties of scaled Ta2O5 RRAM cells
Authors: Chen, Michael
Goux, Ludovic
Fantini, Andrea
Redolfi, Augusto
Clima, Sergiu
Degraeve, Robin
Chen, Yang Yin
Jurczak, Malgorzata
Issue Date: 2014
Publisher: IEEE
Host Document: International Electron Devices Meeting - IEDM pages:355-358
Conference: International Electron Devices Meeting - IEDM location:San Francisco, CA USA date:2014-12-15
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

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