Title: Bias temperature instability analysis of FinFET based SRAM cells
Authors: Khan, Seyab
Agbo, Innocent
Hamdioui, Said
Kukner, Halil
Kaczer, Ben
Raghavan, Praveen
Catthoor, Francky
Issue Date: 2014
Host Document: Design, Automation and Test in Europe Conference - DATE
Conference: Design, Automation and Test in Europe Conference - DATE location:Dresden Germany date:2014-03-24
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems

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