|ITEM METADATA RECORD
|Title: ||Bias temperature instability analysis of FinFET based SRAM cells|
|Authors: ||Khan, Seyab|
|Issue Date: ||2014 |
|Host Document: ||Design, Automation and Test in Europe Conference - DATE|
|Conference: ||Design, Automation and Test in Europe Conference - DATE location:Dresden Germany date:2014-03-24|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Supporting Services Campusmanagement Science, Engineering and Technology|
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