Title: Bias temperature instability analysis of FinFET based SRAM cells
Authors: Khan, Seyab
Agbo, Innocent
Hamdioui, Said
Kukner, Halil
Kaczer, Ben
Raghavan, Praveen
Catthoor, Francky
Issue Date: 2014
Host Document: Design, Automation and Test in Europe Conference - DATE
Conference: Design, Automation and Test in Europe Conference - DATE location:Dresden Germany date:2014-03-24
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science