Title: Failure analysis challenges for 3D stacked ICs
Authors: De Wolf, Ingrid
Phommahaxay, Alain
Wang, Teng
Linten, Dimitri
Guerrieri, Stefano
Issue Date: 2014
Conference: International ESD Workshop - IEW) location:Grenoble France date:2014-05-19
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

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