Title: TID and displacement damage resilience of 1T1R Hfo2 hf resistive memories
Authors: Weeden-Wright, S.L ×
Bennett, W.G
Hooten, N.C
Zhang, E.X
McCurdy, M.W
Schrimpf, R.D
Reed, R.A
Alles, M.C
Linten, Dimitri
Jurczak, Malgorzata
Fantini, Andrea #
Issue Date: 2014
Publisher: Professional Technical Group on Nuclear Science
Series Title: IEEE Transactions on Nuclear Science vol:61 issue:6 pages:2972-2978
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications
× corresponding author
# (joint) last author

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