Title: System-level ESD protection design using on-wafer characterization and transient simulations
Authors: Scholz, Mirko ×
Chen, Shih-Hung
Thijs, Steven
Linten, Dimitri
Hellings, Geert
Vandersteen, Gerd
Sawada, Masanori
Groeseneken, Guido #
Issue Date: 2014
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:14 issue:1 pages:104-111
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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