|ITEM METADATA RECORD
|Title: ||Efficient reliability testing of emerging memory technologies using multiple radiation sources|
|Authors: ||Bennet, W.G|
Mc Curdy, M.W
|Issue Date: ||2014 |
|Host Document: ||23rd Conference on Application of Accelerators in Research and Industry - CAARI pages:1-8|
|Conference: ||23rd Conference on Application of Accelerators in Research and Industry - CAARI location:San Antonio, TX USA date:2014-05-25|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Supporting Services Campusmanagement Science, Engineering and Technology|
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