ITEM METADATA RECORD
Title: Efficient reliability testing of emerging memory technologies using multiple radiation sources
Authors: Bennet, W.G
Hooten, N.C
Weeded-Wright, S
Schrimpf, R.D
Reed, R.A
Alles, M.C
Zhang, E.X
Mc Curdy, M.W
Linten, Dimitri
Jurczak, Malgorzata
Fantini, Andrea
Issue Date: 2014
Host Document: 23rd Conference on Application of Accelerators in Research and Industry - CAARI pages:1-8
Conference: 23rd Conference on Application of Accelerators in Research and Industry - CAARI location:San Antonio, TX USA date:2014-05-25
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

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