Title: Local CDM ESD protection circuits for cross-power domains in 3D IC applications
Authors: Chen, Shih-Hung
Linten, Dimitri
Scholz, Mirko
Huang, Yu-Ching
Hellings, Geert
Boschke, Roman
Ker, Ming-Dou
Groeseneken, Guido
Issue Date: Jun-2014
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:14 issue:2 pages:781-783
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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