ITEM METADATA RECORD
Title: Study of (correlated) trap sites in SILC, BTI and RTN in SiON and HKMG devices
Authors: Bury, Erik
Degraeve, Robin
Cho, Moon Ju
Kaczer, Ben
Goes, Wolfgang
Grasser, Tibor
Horiguchi, Naoto
Groeseneken, Guido
Issue Date: 2014
Host Document: International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA pages:na
Conference: International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA location:Singapore Singapore date:2014-06-30
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

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