|ITEM METADATA RECORD
|Title: ||Study of (correlated) trap sites in SILC, BTI and RTN in SiON and HKMG devices|
|Authors: ||Bury, Erik|
Cho, Moon Ju
|Issue Date: ||2014 |
|Host Document: ||International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA pages:na|
|Conference: ||International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA location:Singapore Singapore date:2014-06-30|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Supporting Services Campusmanagement Science, Engineering and Technology|
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